TE Connectivity NEOHM SMA-Q 412 kΩ, 0204 Thin Film Surface Mount Resistor 0.1 % Surface 0.4 W - SMA-Q0204BTCX412K

Subtotal (1 reel of 3000 units)*

₩988,650.00

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  • 2026년 10월 26일 부터 배송
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3000 +₩329.55₩989,820.00

* 참고 가격: 실제 구매가격과 다를 수 있습니다

RS 제품 번호:
590-325
제조사 부품 번호:
SMA-Q0204BTCX412K
제조업체:
TE Connectivity
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브랜드

TE Connectivity

Resistance

412kΩ

Product Type

Surface Mount Resistor

Resistor Type

Precision

Technology

Thin Film

Package/Case

0204

Tolerance

0.1 %

Packaging

Tape & Reel

Voltage

20V

Power Rating

0.4W

Temperature Coefficient

±25 ppm/°C

Mount Type

Surface

Automotive Standard

AEC-Q200

Series

NEOHM SMA-Q

Minimum Operating Temperature

-55°C

Maximum Operating Temperature

155°C

Length

3.50mm

Standards/Approvals

IEC 60115-1, JIS-C-5201-1, MIL-STD-202, RoHS

Width

1.40mm

COO (Country of Origin):
TW
The TE Connectivity Metal film precision MELF resistor is engineered for applications demanding high reliability and performance. Featuring a robust SMD-enabled structure, this component offers exceptional stability and precision with a low temperature coefficient. It is specifically designed to meet AEC-Q200 standards, ensuring robust performance in automotive environments. The improved coating technology enhances moisture protection, making it suitable for various industrial contexts. This lead-free and RoHS compliant resistor is tailored for critical applications where tight tolerances and reliability are paramount, providing users with a dependable solution suitable for automotive, telecommunication, medical, and industrial uses.

AEC Q200 qualification guarantees reliability in high demand applications

Moisture sensitivity level of MSL1 ensures safe handling and storage

Thin film technology provides superior performance in a compact design

SMD enablement allows for efficient integration into modern circuits

Lead free and RoHS compliant to meet environmental regulations

Extremely low temperature coefficient supports precision applications

Excellent overall stability makes it ideal for critical measurements

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