Aim-TTi TGP3151 Pulse Generator, 1 mHz min, 25 (Double Pulse) MHz, 50 (Pulse) MHz max

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₩2,936,917.20

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RS 제품 번호:
112-0943
제조사 부품 번호:
TGP3151
제조업체:
Aim-TTi
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브랜드

Aim-TTi

Maximum Frequency

25 (Double Pulse) MHz, 50 (Pulse) MHz

Minimum Frequency

1 mHz

Maximum Pulse Width

499.99999999 (Double Pulse) s, 999.99999999 (Pulse) s

Minimum Pulse Width

10ns

Modes

Burst, Double Pulse, Function/Arbitrary, Modulation, Noise, Pattern/PBRS, Pulse, Square, Sweep, Triggered

Maximum Pulse Delay

999.99999996 (Double Pulse) s, 999.99999998 (Pulse) s

Minimum Pulse Delay

0ns

Adjustable Output Amplitude

Yes

Jitter

<30%

Rise - Fall Time

5 ns → 399.999999989 s (Double Pulse), 5 ns → 799.999999989 s (Pulse)

Input Impedance

10 kΩ

Connector Type

USB

Interface Type

GPIB, LAN, LXI, Remote, USB 2.0, USB Flash Drive

Dimensions

269 x 213.5 x 86.5 (Rack Mount) mm, 295 x 250 x 97 (Bench Top Mount) mm

Model Number p

TGP3151

Weight

3.2kg

Width

213.5 (Rack Mount) mm, 250 (Bench Top Mount) mm

Maximum Operating Temperature

+40°C

Length

269 (Rack Mount) mm, 295 (Bench Top Mount) mm

Minimum Operating Temperature

+5°C

Height

86.5 (Rack Mount) mm, 97 (Bench Top Mount) mm

COO (Country of Origin):
GB

Aim-TTi Pulse Generator, 10 kO Input Impedance, 1 Channel - 59120-5340


This pulse generator by Aim-TTi is a versatile and advanced piece of equipment designed for applications in areas such as automation, electronics, electrical, and mechanical industries. With adjustable output amplitude and high frequencies, it offers precise and reliable performance for various applications.

Features & Benefits


• Adjustable output amplitude for precise control
• High frequency capability for applications requiring fast pulses
• Pulse width modulation for flexible waveform generation
• Triggered burst mode for specific pulse sequencing
• Compact design for both benchtop and rack mount applications

Applications


• Used for stress testing designs requiring defined jitter and delay
• Ideal for clock frequency simulation with glitch-free parameter changes
• Suitable for creating data sequencing patterns for serial data testing
• Efficient for asynchronous pulse signal conditioning
• Helps in Op Amp slew rate and asymmetrical characterisation

Can it be used for clock frequency simulation applications?


Yes, it is ideal for simulating clock frequencies with glitch-free changes in pulse parameters.

Will it assist in stress testing designs?


Yes, it is designed for stress testing designs with defined jitter and delay requirements.

Is it suitable for data sequencing patterns?


Yes, it can efficiently generate data sequencing patterns for serial data testing applications.

Can it be used for signal conditioning?


Yes, it is suitable for asynchronous pulse signal conditioning purposes.

Is it helpful in Op Amp slew rate measurements?


Yes, it facilitates Op Amp slew rate and asymmetrical characterisation tasks.

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